BOS (Beam Observation Systems)

            BOS Beam Observation Systems



Beam Imaging Solutions presents the Beam Observation Systems (BOS). The BOS systems provide an easy, quick and low cost solution for beam profile analysis of electron, ion and neutral beams, as well as UV and X-rays. The image is formed using a microchannel plate (MCP) in combination with a phosphor screen assembly. The BOS units have a MCP/phosphor screen assembly mounted to a vacuum flange with electrical feedthroughs for applying voltages to the assembly and with vacuum window for observing the image. Currently, the BOS units are available with 18mm, 25mm, 40mm and 75mm active viewing diameters. In applications in which imaging is required at 90-degrees to the input beam, the new BOS-IW image wedge can be used. These units use the standard BOS MCP/phosphor screen imaging assembly attached to a stainless steel housing with mirror mounted at 45 degrees.



Image of mass separated ion beam showing H+, H2+ and H3+ on the BOS-18 Beam Observation System.

Typical uses for ther BOS include:

Single Particle Position Sensitive Detection

Beam Line Diagnostics Beam Profile Analysis (beam tuning)

Mass Spectrometry

Low Energy and Low Intensity Beam Imaging

X-ray Spectroscopy Field Ion Microscopy

Detailed information about each of the individual BOS units offered can be found at the links shown below.

BOS-18, 18mm , 2.75" (70mm) Conflat Flange Mount

BOS-18, 18mm , 90 degree Mirror "Imaging Wedge"

BOS-25, 25mm , 4.5" (114mm) Conflat Flange Mount

BOS-40, 40mm , 4.5" (114mm) and 6" (152mm) Conflat Flange Mount

BOS-40, 40mm , 90 degree Mirror "Imaging Wedge"

BOS-75, 75mm, 8" (203mm) Conflat Flange Mount

A BOS quotation request form can be used receive current pricing.